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In-Circuit Test - Teradyne TestStation family (TSLX, TSLH, TSSE)
Highest Quality
In-Circuit Test
Teradyne's TestStation™ family of In-Circuit Test Systems provides high volume electronics manufacturers with reliable high-quality test for the latest PCB technologies. Configurable from 256 to 7680 test pins, the TestStation product family provides the highest-capacity in-circuit test solution on the market.
Featuring SafeTest protection technologies and a turnkey test programming environment, the TestStation systems allow direct transfer of test programs and fixtures from all 228X and TestStation in-circuit testers without extra costs or further program development.
Comprehensive Fault Detection
Unpowered test capabilities for TestStation systems include shorts, vectorless opens, and analog value testing. Powered-up test capabilities include digital device vector testing, reduced access boundary scan testing, high speed FLASH and ISP device programming, frequency and time event measurements, synchronized mixed signal device testing, and functional cluster testing. These tests can be automatically generated using Teradyne's D2B CAD preparation software and automatic test generation software or manually created using a simple, but powerful test programming language.
Teradyne's advanced test quality software analyzes the test program and generates reports to show overall test fault coverage and unreliable tests that require additional debug.
Accurate, Reliable, and Safe Electrical Test
The strength of TestStation in-circuit testers lies in their ability to perform accurate, reliable, and safe powered-up testing. Patented SafeTest technologies like per pin programmable logic levels, backdrive current, and backdrive duration thresholds ensure potentially harmful voltage and currents are not applied to the board during device testing (even if the board is defective).
Multi-level digital isolation software automatically isolates device outputs on any nets being driven. This minimizes backdrive conditions and prevents potentially harmful voltage spikes that can occur when backdriven outputs suddenly change logic state. The specialized digital controller quickly executes test vectors to minimize the duration of backdrive currents and reduce the opportunity for voltage spikes that can occur from on-board activities.
Exceptional Diagnostic Accuracy and Test Throughput
TestStation provides excellent diagnostic accuracy because the closed-loop, low-impedance driver remains accurate even under fault conditions. Additionally, the unique programmable backdrive measurement and control capabilities of the TestStation can detect faults such as faulty enable pins and marginal output transistors that can not be detected on other in-circuit testers.
Patented diagnostic algorithms like SoftProbe, BusBust, and Adaptive Patterns are designed to minimize unnecessary board repairs and eliminate false failure reports.
Test Station LH/LX summary:
Multiplexed or non-Multiplexed test points
Ultra-pin technology - 45mV sensor accuracy
Driver range - +5.5v to -2.5v
26 programmable drive levels
Independent dual level Driver and Sensor thresholds
Integrated Analog instrumentation with 8 channel measurement matrix
Fast, Automatic test program generation software
PC based Window XP.
TestStation LH
256 - 4096 Test points
Small footprint ( 43.5" x 35")
TestStation LX
256 - 7680 Test points
TestStation SE
The TestStation SE is configurable with up to 2560 non-multiplexed in-circuit channels. TestStation SE has 20 Extended VXI card slots for adding analog-only channel cards (CC1s), hybrid digital/analog channel cards (CC2s), high speed flash programming cards(CC3's) or integrating C-sized VXI instruments.
Key Features:
Compatible with existing Z18xx programs and fixtures (with optional personality plate)
Graphic / language-free worksheet programming, but also has a standard programming language when needed
PC-based, with native Windows XP operating system
No compilation, live pattern editing, but with a graphic GUI and more debug tools
Non-multiplexed (driver/receiver behind every pin)
Up to 2560 non-multiplexed channels
High density/high performance fixture interface with optional wireless personality plate for using existing Z18xx fixtures
Easy in-line implementation
Compact footprint
Comprehensive Multiscan Vectorless test toolset
Victory Boundary Scan test suite
Fully synchronised testing of mixed signal devices such as ADC, DAC and CODECs
Z18xx optional capabilities (PRISM high performance analog test, Vector Processor, 3V logic support, DFP flash programming) are standard in the TestStation SE
Advanced ILDPprogramming using the Lightning &tm; module
D2B compatible
Functional system upgrade option with internal VXI card capability
The TestStation SE is also fully compatible with existing Spectrum 8851 and 8852 ICT-only systems. In addition, the TestStation SE can optionally support the integration of VXI instruments, but for Spectrum users that require any significant addition of VXI instrumentation, we recommend the use of the Spectrum 885Xxp system.